Apparatus for controlling test inputs of circuits on an electron

Details Apparatus for controlling test inputs of circuits on an electron Apparatus for controlling test inputs of circuits on an electron

1992-07-31

1995-04-11

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, G01R 3128

Patent

active

054061970

ABSTRACT:
A circuit reduces the cost of electronic systems that contain integrated circuit chips with test leads by reducing the number of off-module connections required to drive these test leads in the assembled system. Instead of driving each such test lead through an intermodule interconnector, a single MODULE TEST line coming in through the intermodule interconnector is input to a circuit that then drives all chip test leads to an appropriate state in the assembled system, while leaving those test leads in a high-impedance state during test, allowing a module tester to drive them as required by its test program.

REFERENCES:
patent: 3789205 (1974-01-01), James
patent: 4743841 (1985-05-01), Takeuchi
patent: 5012185 (1991-04-01), Ohfuji
patent: 5032789 (1991-07-01), Firooz et al.
patent: 5101151 (1992-03-01), Beaufils et al.
patent: 5124636 (1992-06-01), Pincus et al.
patent: 5126953 (1992-06-01), Berger et al.
patent: 5131272 (1992-07-01), Menei et al.
patent: 5132635 (1992-07-01), Kennedy

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