Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2010-03-11
2010-10-19
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07816936
ABSTRACT:
A semiconductor integrated circuit apparatus includes an internal circuit having a MIS transistors on a semiconductor substrate and a substrate voltage control block that supplies a substrate voltage to the internal circuit and controls threshold voltages for the MIS transistors of the internal circuit. The apparatus also includes a leakage current detection MIS transistor and a leakage current detection circuit. The substrate voltage control block generates a substrate voltage based on comparison results of the comparator and applies the generated substrate voltage to the substrate of the leakage current detection MIS transistor and the substrate of the MIS transistors of the internal circuit. The substrate voltage control block includes a switch arranged between first and second input terminals of a comparator and a drain of the leakage current detection MIS transistor and a reference potential terminal, as well as an input data corrector that carries out substrate voltage adjustment.
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Greenblum & Bernstein P.L.C.
Panasonic Corporation
Tang Minh N
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