Apparatus for controlling semiconductor chip characteristics

Details Apparatus for controlling semiconductor chip characteristics Apparatus for controlling semiconductor chip characteristics

2002-10-17

2008-12-30

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S118000, C702S124000, C702S182000, C702S189000

Reexamination Certificate

active

07472033

ABSTRACT:
Apparatus including functional components of circuitry defined on a semiconductor chip, the functional components including a component having modifiable operating characteristics, a performance measuring circuit providing an output indicative of operating characteristics of the circuitry defined on the semiconductor chip during operation of the circuitry, and computer implemented software means for controlling a value for an operating characteristic of the component having modifiable operating characteristics in response to the output provided by the performance measuring circuit.

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