Electricity: measuring and testing – Magnetic – Magnetometers
Reexamination Certificate
2008-04-08
2008-04-08
LeDynh, Bot (Department: 2862)
Electricity: measuring and testing
Magnetic
Magnetometers
C505S846000, C324S244000, C324S261000
Reexamination Certificate
active
11621260
ABSTRACT:
An apparatus for controlling and adjusting the magnetic state of a magnetic probe for detecting magnetic signals of a sample, it employs a negative feedback control unit to counter the change of magnetization of the magnetic probe. The local magnetic field of the sample influences the magnetization of the magnetic probe. Through the feedback coil inductively coupled to the magnetic probe, the variation of magnetization of the magnetic probe is compensated by the magnetization induced by the feedback coil. This apparatus is capable of reducing the magnetic interaction between the magnetic probe and sample. Meanwhile, a current bias unit is used for adjusting the magnetization of the magnetic probe to an arbitrary value. This capability allows a scanning probe microscope applying this invention to manipulate magnetic objects.
REFERENCES:
patent: 5331491 (1994-07-01), Hayakawa et al.
patent: 6657431 (2003-12-01), Xiao
patent: 6696833 (2004-02-01), Hong et al.
patent: 6717402 (2004-04-01), Mukasa et al.
Chi Cheng-Chung
Liao Yang-Chung
Wang Ming-Jye
LeDynh Bot
Lowe Hauptman & Ham & Berner, LLP
National Tisng Hau University
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