Apparatus for controlling a plasma reaction

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With microwave gas energizing means

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156626, 204298, 219121PF, 250573, 356316, C23C 1500, C23F 100

Patent

active

043571956

ABSTRACT:
An apparatus and method for controlling a plasma etching reaction. The plasma reaction is controlled by monitoring the output voltage of an optical detector which is responsive to emissions emanating from the reaction. As the output of the detector changes indicating that the first portion of the etching process has been completed, the average power density supplied to the reaction is reduced by switching the applied power from a continuous wave to a pulsed mode. The reaction is allowed to continue to completion in the reduced power mode.

REFERENCES:
patent: 3514604 (1970-05-01), Grojean
patent: 4166784 (1979-09-01), Chapin et al.
patent: 4263089 (1981-04-01), Keller
patent: 4317698 (1982-03-01), Christol et al.
patent: 4332833 (1982-06-01), Aspnes et al.
Oshima "Optical . . . Control", Jap. J. of Applied Physics, vol 20, No. 4 (4/81), pp. 683-690.

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