Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-06-02
1995-06-13
Hille, Rolf
Optics: measuring and testing
By polarized light examination
With light attenuation
356241, 250561, G01B 1124, G01N 2186
Patent
active
054248361
ABSTRACT:
A description is given of an apparatus for the contact-free, spatial measurement of a poorly accessible, three-dimensional object (9) optically by taking surface photographs, having an optic ray source, a recording unit (10, 11) for recording optic rays (15, 18, 19, 25), and an evaluation unit for the evaluation of the data transmitted by the optic rays. In order to make it possible for objects to be measured accurately, preferably in space, in contact-free manner in confined spaces, and for the measuring data results to be recorded, the invention provides that a carrier (4) is movable on at least one guide device (2) relative to the object (9) on a guide track (3) towards the frame (1), that the carrier (4) is able to travel on the guide device (2) by means of a motor (7), that a deflector device (12, 13, 13') is fixed to the carrier (4) in such a way that at least one ray (18, 19, 25; 18', 19', 25') reflected by the object is deflected towards the recording unit (10, 11), that the position and orientation of the frame (1) relative to the object (9) is clearly defined at any time, that the position and orientation of the carrier (4) relative to the frame (1) is clearly defined at any time, that the evaluation unit (11a) has devices for storing data relating to the rays (18', 19', 25') reflected by the object (9) in the form of image elements, -lines, and/or image planes, and that the evaluation unit (11a) has devices for the processing of image data stored.
REFERENCES:
patent: 4500206 (1985-02-01), Cole et al.
patent: 4668192 (1987-05-01), Lavin
patent: 4900144 (1990-02-01), Kobayashi
patent: 5004929 (1991-04-01), Kakinoki et al.
patent: 5111056 (1992-05-01), Yoshimura et al.
Rubbert Rudger
Weise Thomas
Geyer Medizin- und Fertigungstechnik GmbH
Hille Rolf
Tran Minhloan
LandOfFree
Apparatus for contact-free optical measurement of a three-dimens does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for contact-free optical measurement of a three-dimens, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for contact-free optical measurement of a three-dimens will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1314191