Apparatus for contact-free measurement of electrical charge imag

Details Apparatus for contact-free measurement of electrical charge imag Apparatus for contact-free measurement of electrical charge imag

1983-07-12

1985-09-10

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Recording apparatus

378 28, H04N 102

Patent

active

045410178

ABSTRACT:
An apparatus for contact-free measurement of electrical charge images of the type generated on a storage plate as transmission images by means of electro-radiographic recording methods has a matrix of dynamically functioning probes, such as Kelvin probes, for scanning the effect of the electrostatic induction caused by the image on the storage plate, the outputs of the probes being amplified and supplied to a display device such as a picture screen. The individual probes of the matrix are electrically conductive elements and a mechanical oscillation is generated between the charge image and the probes in the field to be measured either by oscillating the probes or by oscillating the storage plate. The charge amounts electrostatically induced in the probes are tapped as the image signals.

REFERENCES:
patent: 3737569 (1973-06-01), Snelling
patent: 4134137 (1979-01-01), Jacobs et al.
patent: 4319284 (1982-03-01), Kiess et al.
Stoffel, J. C. "Surface Relief Electrometer Type Scanner" Xerox Discl. Journal, vol. 6, No. 5, 9-10/81.
Stoffel, J. C., et al., "Microelectrometer Raster Input Scanner" Xerox Discl. Journal, vol. 6, No. 5, 9-10/81.
"Electrophotography", Schaffert, 1975, pp. 191-201 and 950-952.
"Development of a Large-Area Solid-State Image Receptor for X-Ray Images," Xerox Corp. Technical Annual Report, Oct. 1978, M. Ein-Gal, Mgr.
"Semiconductor Surfaces," Many et al, 1971, pp. 274-275.

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