Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2007-04-03
2007-04-03
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
Reexamination Certificate
active
11220243
ABSTRACT:
A test apparatus including a data interface configured to couple with at least one of a test device and a baseline device, and a computing device configured to perform a method including performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline devices, performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device, and using a heuristic including a number of tests to determine whether the test device has an acceptable level of performance relative to the baseline device.
REFERENCES:
patent: 5303166 (1994-04-01), Amalfitano et al.
patent: 2005/0049847 (2005-03-01), Miyamoto et al.
U.S. Appl. No. 11/219,968.
Barr Terrence
Davidov Eran
Gurchinoff David C.
Parks Michael J.
Riggs Jamie D.
Bui Bryan
Lau Tung S.
Osha & Liang LLP
Sun Microsystems Inc.
LandOfFree
Apparatus for comparing performance of electronic devices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for comparing performance of electronic devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for comparing performance of electronic devices will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3739860