Apparatus for characterizing an optic

Details Apparatus for characterizing an optic Apparatus for characterizing an optic

1993-07-27

1996-05-14

Pham, Hoa Q.

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

25055942, G01N 2132

Patent

active

055173012

ABSTRACT:
An apparatus (10) for characterizing an optic (14) includes a light source (20) adapted to direct a light beam into an optic (14) such that total internal reflection of the light beam occurs. A light detector (38) is disposed to detect light exiting the optic (14). The apparatus (10) also includes a reservoir for holding and dispensing an index of refraction matching fluid between the optic (14) and the light detector (38) to enable light to exit the optic (14) toward the light detector (38) such that the material of the optic (14) is characterized rather than merely the surface thereof.

REFERENCES:
patent: H376 (1987-12-01), Bremer
patent: 3460893 (1969-08-01), Wilks, Jr.
patent: 3737665 (1973-06-01), Nagae
patent: 3988068 (1976-10-01), Sprague
patent: 4297032 (1981-10-01), Temple
patent: 4401893 (1983-08-01), Dehuysser
patent: 4456374 (1984-06-01), Langberg
patent: 4481450 (1984-11-01), Watanabe et al.
patent: 4808813 (1989-02-01), Champetier
patent: 5152600 (1992-10-01), Boring
patent: 5196901 (1993-03-01), Champetier

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