Electricity: measuring and testing – Electrolyte properties – Using a battery testing device
Reexamination Certificate
2000-09-05
2001-10-16
Wong, Peter S. (Department: 2838)
Electricity: measuring and testing
Electrolyte properties
Using a battery testing device
C324S433000, C320S132000
Reexamination Certificate
active
06304087
ABSTRACT:
BACKGROUND OF THE INVENTION
The present invention relates to electronic battery testers of the type used for testing storage batteries. More particularly, the present invention relates to a calibrator for calibrating such electronic battery testers.
Chemical storage batteries, such as lead acid batteries used in automobiles, have existed for many years. In order to make optimum use of such a battery, it is very desirable to test the battery to determine various battery parameters such as state of charge, battery capacity, state of health, the existence of battery defects.
Various techniques have been used to measure battery parameters. For example, hygrometers have been used to measure the specific gravity of a battery and simple voltage measurements have been used to monitor the voltage of the battery. One battery testing technique which has been popular for many years is known as a load test in which a battery is heavily loaded over a period of time and the decay in the battery output is monitored. However, such a test is time consuming and leaves the battery in a relatively discharged condition. Further, such a tester must be made relatively large if it is to be used with large batteries.
A much more elegant technique has been pioneered by Midtronics, Inc. of Burr Ridge, Ill. and Dr. Keith S. Champlin in which battery parameters are determined based upon a measurement of the battery's conductance. This work is set forth in, for example, the following patents: U.S. Pat. No. 3,873,911, issued Mar. 25, 1975, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE; U.S. Pat. No. 3,909,708, issued Sep. 30, 1975, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE; U.S. Pat. No. 4,816,768, issued Mar. 28, 1989, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE; U.S. Pat. No. 4,825,170, issued Apr. 25, 1989, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE WITH AUTOMATIC VOLTAGE SCALING; U.S. Pat. No. 4,881,038, issued Nov. 14, 1989, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE WITH AUTOMATIC VOLTAGE SCALING TO DETERMINE DYNAMIC CONDUCTANCE; U.S. Pat. No. 4,912,416, issued Mar. 27, 1990, to Champlin, entitled ELECTRONIC BATTERY TESTING DEVICE WITH STATE-OF-CHARGE COMPENSATION; U.S. Pat. No. 5,140,269, issued Aug. 18, 1992, to Champlin, entitled ELECTRONIC TESTER FOR ASSESSING BATTERY/CELL CAPACITY; U.S. Pat. No. 5,343,380, issued Aug. 30, 1994, entitled METHOD AND APPARATUS FOR SUPPRESSING TIME VARYING SIGNALS IN BATTERIES UNDERGOING CHARGING OR DISCHARGING; U.S. Pat. No. 5,572,136, issued Nov. 5, 1996, entitled ELECTRONIC BATTERY TESTER WITH AUTOMATIC COMPENSATION FOR LOW STATE-OF-CHARGE; U.S. Pat. No. 5,574,355, issued Nov. 12, 1996, entitled METHOD AND APPARATUS FOR DETECTION AND CONTROL OF THERMAL RUNAWAY IN A BATTERY UNDER CHARGE; U.S. Pat. No. 5,585,728, issued Dec. 17, 1996, entitled ELECTRONIC BATTERY TESTER WITH AUTOMATIC COMPENSATION FOR LOW STATE-OF-CHARGE; U.S. Pat. No. 5,592,093, issued Jan. 7, 1997, entitled ELECTRONIC BATTERY TESTING DEVICE LOOSE TERMINAL CONNECTION DETECTION VIA A COMPARISON CIRCUIT; U.S. Pat. No. 5,598,098, issued Jan. 28, 1997, entitled ELECTRONIC BATTERY TESTER WITH VERY HIGH NOISE IMMUNITY; U.S. Pat. No. 5,757,192, issued May 26, 1998, entitled METHOD AND APPARATUS FOR DETECTING A BAD CELL IN A STORAGE BATTERY; U.S. Pat. No. 5,821,756, issued Oct. 13, 1998, entitled ELECTRONIC BATTERY TESTER WITH TAILORED COMPENSATION FOR LOW STATE-OF-CHARGE; U.S. Pat. No. 5,831,435, issued Nov. 3, 1998, entitled BATTERY TESTER FOR JIS STANDARD; U.S. Pat. No. 5,914,605, issued Jun. 22, 1999, entitled ELECTRONIC BATTERY TESTER; U.S. Pat. No. 5,945,829, issued Aug. 31, 1999, entitled MIDPOINT BATTERY MONITORING; U.S. Pat. No. 6,002,238, issued Dec. 14, 1999, entitled METHOD AND APPARATUS FOR MEASURING COMPLEX IMPEDANCE OF CELLS AND BATTERIES; U.S. Pat. No. 6,037,777, issued Mar. 14, 2000, entitled METHOD AND APPARATUS FOR DETERMINING BATTERY PROPERTIES FROM COMPLEX IMPEDANCE/ADMITTANCE; and U.S. Pat. No. 6,051,976, issued Apr. 18, 2000, entitled METHOD AND APPARATUS FOR AUDITING A BATTERY TEST.
In general, these more advanced electronic battery testers have used Kelvin connections to couple to terminals of the battery. For example, a first connection in a first Kelvin connection and a second Kelvin connection can be used to apply a forcing function to the battery. A second connection in the first Kelvin connection and a second connection in the second Kelvin connection can be used to measure a response of the battery to the applied forcing function. Typically, the electronic battery tester must be calibrated to ensure that it is performing accurate battery tests. A simple calibration fixture consists of a calibrated resistance in series with a power supply designed to simulate a storage battery. However, there is an ongoing need to improve the accuracy and efficiency of the calibration process.
SUMMARY OF THE INVENTION
A calibration fixture is provided for calibrating an electronic battery tester which has first and second battery tester Kelvin connections configured to couple to terminals of a battery. The calibration fixture includes a first Kelvin connection has an A′ terminal and a C′ terminal configured to couple to the first battery tester Kelvin connection and a second Kelvin connection having a B′ terminal and a D′ terminal configured to couple to the second battery tester Kelvin connection. A calibrated shunt is in series with a power supply connected between the A′ terminal of the first Kelvin connection and the B′ terminal of the second Kelvin connection. The calibrated shunt has a calibrated resistance value. An active shunt is placed in series between the C′ terminal of the first Kelvin connection and the D′ terminal of the second Kelvin connection. The active shunt provides a calibrated apparent resistance between the C′ and D′ terminal which is a function of the calibrated resistance value of the calibrated shunt.
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Midtronics Inc.
Toatley Jr. Gregory J
Westman Champlin & Kelly P.A.
Wong Peter S.
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