Apparatus for automatic preparation of measurement programs

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371 27, G01R 3128, G06F 1130

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active

049775316

ABSTRACT:
An apparatus for automatically preparing measurement programs is used in operating measurement apparatus for measuring the properties of electronic circuits such as intergrated circuits (ICs). The apparatus includes a measurement quality verification apparatus which modifies and standardizes measurement specifications input through a measurement specifications input apparatus. It further includes a measurement condition setting table preparing apparatus which develops these measurement specifications into a measurement condition setting table, which is transformed into a measurement program by a measurement program transformation apparatus.

REFERENCES:
patent: 4550406 (1985-10-01), Neal
patent: 4606025 (1986-08-01), Peters et al.
Wilber, "Enhancing Device Test Programming Productivity: The Catalyst Automated Test Program Generator", 1985 Int'l Test Conference IEEE 1985 pp. 252-262.

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