Apparatus for and method of processing substrate

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – For liquid etchant

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C156S345110, C156S345130, C156S345210

Reexamination Certificate

active

08043468

ABSTRACT:
A substrate processing apparatus discharges a hydrofluoric acid solution from discharge nozzles toward grooves formed in side walls of an inner bath. The hydrofluoric acid solution discharged from the discharge nozzles impinges upon the grooves to diffuse, thereby moving toward a top portion of the inner bath in the form of low-speed uniform liquid flows. Thus, a metal component and foreign substances generated in the inner bath float up toward the top portion of the inner bath without being agitated within the inner bath, and are rapidly drained to an outer bath together with the hydrofluoric acid solution.

REFERENCES:
patent: 5980129 (1999-11-01), Yale
patent: 6780277 (2004-08-01), Yokomizo et al.
patent: 7541285 (2009-06-01), Abiko et al.
patent: 2005/0258085 (2005-11-01), Hiroe et al.
patent: 2006/0213542 (2006-09-01), Abiko et al.
patent: 2008/0023444 (2008-01-01), Osawa
patent: 2008/0096393 (2008-04-01), Kim et al.
patent: 2009/0080879 (2009-03-01), Osawa et al.
patent: 2009/0239384 (2009-09-01), Fujiwara et al.
patent: 1963992 (2007-05-01), None
patent: 2000-70827 (2000-03-01), None
patent: 2001-196343 (2001-07-01), None
patent: 2004-281728 (2004-10-01), None
patent: 2005-26478 (2005-01-01), None
patent: 2007-36189 (2007-02-01), None
patent: 2007-49022 (2007-02-01), None
Decision to Grant issued by Korean Patent Office on Aug. 23, 2010 in connection with corresponding Korean application No. 10-2008-0090369.
Office Action issued by Korean Patent Office on May 27, 2010 in connection with corresponding Korean patent application No. 10-2008-0090369.
English translation of relevant portions of Korean Office Action issued May 27, 2010.
Chinese Office Action dated Dec. 18, 2009 with English translation.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus for and method of processing substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for and method of processing substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for and method of processing substrate will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4279275

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.