Pulse or digital communications – Testing – Phase error or phase jitter
Reexamination Certificate
2007-04-10
2007-04-10
Ghayour, Mohammed (Department: 2611)
Pulse or digital communications
Testing
Phase error or phase jitter
C702S069000
Reexamination Certificate
active
09882290
ABSTRACT:
A signal under measurement is band-limited, and frequency components around a fundamental frequency of the signal under measurement are extracted. Waveform data (approximated zero-crossing data) close to zero-crossing timings of the band-limited signal are sampled, and phase error data between the approximated zero-crossing points and the corresponding zero-crossing points of the signal under measurement are calculated from the approximated zero-crossing data to obtain a zero-crossing phase error data sequence δ[k]. Then an instantaneous period sequence T(k) of the signal under measurement is obtained from the zero-crossing phase error data and sampling intervals Tk,k+1of the approximated zero-crossing data sequence. Then a period jitter sequence is obtained from differences between the T(k) and a fundamental period T0of the signal under measurement, and then the period jitter sequence is multiplied by T0/Tk,k+1to correct the period jitter sequence.
REFERENCES:
patent: 3995222 (1976-11-01), Mitarai
patent: 4654861 (1987-03-01), Godard
patent: 5923706 (1999-07-01), Marz
patent: 6133783 (2000-10-01), Stockman et al.
patent: 6208169 (2001-03-01), Wong et al.
patent: 6240130 (2001-05-01), Burns et al.
patent: 6291979 (2001-09-01), Soma et al.
patent: 6400129 (2002-06-01), Yamaguchi et al.
patent: 6460001 (2002-10-01), Yamaguchi et al.
patent: 6522122 (2003-02-01), Watanabe et al.
patent: 6525523 (2003-02-01), Soma et al.
patent: 6687629 (2004-02-01), Yamaguchi et al.
patent: 6775321 (2004-08-01), Soma et al.
patent: 6795496 (2004-09-01), Soma et al.
patent: 2002/0103609 (2002-08-01), Kuyel
patent: 2002/0136337 (2002-09-01), Chatterjee et al.
patent: 2002/0176491 (2002-11-01), Kleck et al.
patent: 2003/0076181 (2003-04-01), Tabatabaei et al.
Nelson Soo, PERICOM Application Brief AB36, “Jitter Measurement Techniques”.
Ishida Masahiro
Soma Mani
Yamaguchi Takahiro
Advantest Corporation
Gallagher & Lathrop
Ghayour Mohammed
Lathrop, Esq. David N.
Vlahos Sophia
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