Apparatus for and method of measuring jitter

Details Apparatus for and method of measuring jitter Apparatus for and method of measuring jitter

2005-07-26

2005-07-26

Ha, Dac V. (Department: 2634)

Pulse or digital communications

Testing

Phase error or phase jitter

C375S371000, C327S078000, C370S516000, C324S612000

Reexamination Certificate

active

06922439

ABSTRACT:
A signal under measurement x(t) is transformed into a complex analytic signal zc(t), and an instantaneous phase of the xc(t) is estimated using the zc(t). A linear phase is removed from the instantaneous phase to obtain a phase noise waveform Δφ(t) of the x(t), and the Δφ(t) is sampled at a timing close to a zero-crossing timing of the x(t) to obtain a timing jitter sequence. Then a difference sequence of the timing jitter sequence is calculated to obtain a period jitter sequence. The period jitter sequence is multiplied by a ratio T0/Tk,k+1of the fundamental period T0of the x(t) and the sampling time interval Tk,k+1to make a correction of the period jitter sequence. A period jitter value of the x(t) is obtained from the corrected period jitter sequence.

REFERENCES:
patent: 5923706 (1999-07-01), Marz
patent: 6240130 (2001-05-01), Burns et al.
patent: 6295315 (2001-09-01), Frisch et al.
patent: 6377644 (2002-04-01), Naudet
Yamaguchi, T., et al., “Extraction of peak-to-peak and RMS sinusoidal jitter using an analytic signal method,” Proceedings 18th IEEE VLSI Test Symposium, Montreal, Quebec, Canada, Apr. 30-May 4, 2000, pp. 395-402.

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