Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1988-09-23
1991-12-17
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324605, 324649, 324658, G01R 2726
Patent
active
050737570
ABSTRACT:
An apparatus for and a method of measuring capacitance employs a charge measuring system. While a capacitive element, which may be an unknown capacitor, is charged completely to a predetermined voltage, a charge proportional to the capacitance of the capacitive element is accumulated on the feedback capacitor of an integrating operational amplifier. Thereafter, the charge is measured by measuring the time required to completely remove the charge from the feedback capacitor using the same predetermined voltage as a reference. In a preferred embodiment, the present invention is manifested as a capacitance measurement feature in a hand-held multimeter wherein a largely conventional dual-slope analog-to-digital converter is employed as the charge measuring system.
REFERENCES:
patent: 3824459 (1974-07-01), Uchida
patent: 3947760 (1976-03-01), Noguchi et al.
patent: 4040041 (1977-08-01), Fletcher et al.
patent: 4636714 (1987-01-01), Allen
John Fluke Mfg. Co. Inc.
Mueller Robert W.
Noe George T.
Wieder Kenneth A.
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