Apparatus for and method of forming a parallel ion beam

Details Apparatus for and method of forming a parallel ion beam Apparatus for and method of forming a parallel ion beam

1995-05-19

1996-10-29

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Cyclically varying ion selecting field means

250282, 250287, 250423R, B01D 5944, H01J 4900

Patent

active

055699170

ABSTRACT:
A time-of-flight mass spectrometer includes an ion beam source having a quadrupole ion trap. To form a parallel ion beam, the ions are simultaneously sucked and pulsed out of an interaction region of the trap through an opening in a front end cap electrode of the trap by applying different polarity voltage pulses at the same time to the front end cap electrode and a back end cap electrode of the trap.

REFERENCES:
patent: 3922543 (1975-11-01), Beachamp
patent: 5171991 (1992-12-01), Johnson et al.

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