Apparatus for and method of biasing a transistor

Details Apparatus for and method of biasing a transistor Apparatus for and method of biasing a transistor

2008-01-29

2008-01-29

Pascal, Robert (Department: 2817)

Amplifiers

With amplifier condition indicating or testing means

C330S296000

Reexamination Certificate

active

07323929

ABSTRACT:
An apparatus for biasing a transistor, comprising: a controllable bias generator; a test circuit; a digital Mthorder differentiator responsive to an output of the test circuit; and a controller responsive to the digital Mthorder differentiator for controlling the controllable bias generator; wherein the test circuit is configured to calculate an Lthorder derivative of the transistor's performance.

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Kang, S., et al, “Linearity Analysis of CMOS for RF Application”, IEEE Transactions on Microwave Theory and Techniques, vol. 51, No. 3, Mar. 2003.
PCT Search Report, PCT/US2007/005749, Jul. 4, 2007.

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