Apparatus for analyzing samples by electromagnetic irradiation

Details Apparatus for analyzing samples by electromagnetic irradiation Apparatus for analyzing samples by electromagnetic irradiation

1978-08-31

1980-07-22

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

With sample supply means

250423P, B01D 5944, H01J 3934

Patent

active

042141591

ABSTRACT:
An apparatus for analyzing a sample by electromagnetic irradiation includes a vacuum chamber, a support for holding the sample in the vacuum chamber, an arrangement for irradiating the sample with an electromagnetic beam, a mass analyzer disposed in the vacuum chamber, an arrangement for extracting particles from the sample and introducing them into the mass analyzer and a layer of conductive material situated in the vicinity of support in the zone of the sample.

REFERENCES:
patent: 3406349 (1968-10-01), Swain et al.
patent: 3521054 (1970-07-01), Poschenriedge et al.
patent: 3644731 (1972-02-01), Eloy
patent: 4001582 (1977-01-01), Castaing et al.

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