Apparatus for analyzing radiating electromagnetic wave from mult

Details Apparatus for analyzing radiating electromagnetic wave from mult Apparatus for analyzing radiating electromagnetic wave from mult

1998-03-23

2000-10-10

Teska, Kevin J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Frequency of cyclic current or voltage

39550025, 324260, G06F 1750

Patent

active

061294594

ABSTRACT:
The electromagnetic field intensity of an electromagnetic wave radiating from a multilayer substrate is correctly computed. A radiating electromagnetic wave analysis apparatus comprises a signal layer electric current distribution computation unit for obtaining the distribution of an electric current flowing through a signal layer in a distributed constant line approximation method or a transmission line analysis method; a multilayer substrate electric current distribution computation unit for computing the distribution of an electric current of an entire multilayer substrate in a moment method based on the distribution of the electric current obtained by the signal layer electric current distribution computation unit; and an electromagnetic field intensity computation unit for computing the electromagnetic field intensity of an electromagnetic wave radiating from a multilayer substrate based on the distribution of the electric current of the entire multilayer substrate computed by the multilayer substrate electric current distribution computation unit. The radiating electromagnetic wave analysis apparatus establishes a modelling method for quantitatively analyzing the state of the electric current flowing through a wave source and load and then flowing into a power supply layer and a ground layer.

REFERENCES:
patent: 5006788 (1991-04-01), Goulette et al.
patent: 5650935 (1997-07-01), Nishino et al.
patent: 5745370 (1998-04-01), Ohtou et al.
patent: 5812434 (1998-09-01), Nagase et al.
patent: 5903477 (1999-05-01), Otsu et al.

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