Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1977-01-17
1979-10-09
Clark, Conrad J.
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, G01B 902
Patent
active
041704169
ABSTRACT:
Apparatus for detecting the presence and/or determining the intensity and/or determining the wavelength and/or determining the threshold direction of coherent radiation in the presence of incoherent ambient radiation.
A preferred form of apparatus includes a Fabry-Perot etalon having three regions of different thickness such that the optical phase difference between the second region and third adjacent region is less than .pi. and the optical phase difference between the first and second regions is substantially greater than the optical phase difference between the second and third regions; the etalon having a first surface positioned to receive coherent radiation and a second surface, the average distance between the surfaces being such that the optical path difference between transmitted portions of radiation impinging on the first surface is substantially greater than the coherence length of the coherent radiation; said etalon being modulated with respect to the source of coherent radiation; elements for detecting radiation transmitted through each of the regions and for generating separate first, second and third signals, respectively responsive to the radiation leaving each of the regions, elements for detecting the phase difference between the detected signals, and elements for determining the wavelength of the coherent radiation corresponding to the detected phase differences.
REFERENCES:
patent: 3531207 (1970-09-01), Lee
patent: 3824018 (1974-07-01), Crane, Jr.
patent: 4006356 (1977-02-01), Johnson et al.
Clark Conrad J.
Giarrantana Salvatore A.
Grimes Edwin T.
Masselle Francis L.
The Perkin-Elmer Corporation
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