Apparatus for analysing the condition of a machine

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S183000, C702S186000, C702S188000

Reexamination Certificate

active

10501767

ABSTRACT:
An apparatus for analysing the condition of a machine having a rotating shaft, includes: at least one input for receiving measurement data from a sensor for surveying a measuring point of the machine, the measurement data being dependent on rotation of the shaft; and a data processing device for processing condition data dependent on the measurement data. The data processing device includes a device for performing a plurality of condition monitoring functions (F1, F2, Fn), wherein the data processing device includes a Field Programmable Gate Array circuit coupled to the at least one input.

REFERENCES:
patent: 3848112 (1974-11-01), Weichselbaum et al.
patent: 3902052 (1975-08-01), Amar et al.
patent: 3913084 (1975-10-01), Bollinger et al.
patent: 4121574 (1978-10-01), Lester
patent: 4280185 (1981-07-01), Martin
patent: 4408285 (1983-10-01), Sisson et al.
patent: 4426641 (1984-01-01), Kurihara et al.
patent: 4518855 (1985-05-01), Malak
patent: 4520674 (1985-06-01), Canada et al.
patent: 4530240 (1985-07-01), Board et al.
patent: 4550311 (1985-10-01), Galloway et al.
patent: 4559828 (1985-12-01), Liszka
patent: 4612620 (1986-09-01), Davis et al.
patent: 4615216 (1986-10-01), Vykoupil
patent: 4621263 (1986-11-01), Takenaka et al.
patent: 4669315 (1987-06-01), Sato et al.
patent: 4721849 (1988-01-01), Davis et al.
patent: 4768380 (1988-09-01), Vermeiren et al.
patent: 4800512 (1989-01-01), Busch
patent: 4827771 (1989-05-01), Cary et al.
patent: 4885707 (1989-12-01), Nichol et al.
patent: 5162725 (1992-11-01), Hodson et al.
patent: 5191327 (1993-03-01), Talmadge et al.
patent: 5206818 (1993-04-01), Speranza
patent: 5251151 (1993-10-01), Demjanenko et al.
patent: 5257208 (1993-10-01), Brown et al.
patent: 5319962 (1994-06-01), Kaminski et al.
patent: 5335186 (1994-08-01), Tarrant
patent: 5377128 (1994-12-01), McBean
patent: 5379643 (1995-01-01), Taylor
patent: 5430663 (1995-07-01), Judd et al.
patent: 5479359 (1995-12-01), Rogero et al.
patent: 5501105 (1996-03-01), Hernandez et al.
patent: 5511422 (1996-04-01), Hernandez
patent: 5515266 (1996-05-01), Meyer
patent: 5517183 (1996-05-01), Bozeman, Jr.
patent: 5530343 (1996-06-01), Bowers, III et al.
patent: 5533413 (1996-07-01), Kobayashi et al.
patent: 5544073 (1996-08-01), Piety et al.
patent: 5555457 (1996-09-01), Campbell et al.
patent: 5579241 (1996-11-01), Corby, Jr. et al.
patent: 5584796 (1996-12-01), Cohen
patent: 5586305 (1996-12-01), Eidson et al.
patent: 5633811 (1997-05-01), Canada et al.
patent: 5636281 (1997-06-01), Antonini
patent: 5663811 (1997-09-01), Shimizu
patent: 5808903 (1998-09-01), Schiltz et al.
patent: 5850556 (1998-12-01), Grivna
patent: 5956658 (1999-09-01), McMahon
patent: 5992237 (1999-11-01), McCarty et al.
patent: 6006164 (1999-12-01), McCarty et al.
patent: 6078874 (2000-06-01), Piety et al.
patent: 6115676 (2000-09-01), Rector et al.
patent: 6202491 (2001-03-01), McCarty et al.
patent: 6208944 (2001-03-01), Franke et al.
patent: 6260004 (2001-07-01), Hays et al.
patent: 6324487 (2001-11-01), Qian et al.
patent: 6326758 (2001-12-01), Discenzo
patent: 6346807 (2002-02-01), Slates
patent: 6484109 (2002-11-01), Lofall
patent: 6499349 (2002-12-01), Aronsson
patent: 6516304 (2003-02-01), Yoshimura
patent: 6557752 (2003-05-01), Yacoob
patent: 6725723 (2004-04-01), Aronsson et al.
patent: 6892063 (2005-05-01), Savolainen
patent: 6915235 (2005-07-01), Reeves et al.
patent: 6938177 (2005-08-01), Blemel
patent: 2001/0001136 (2001-05-01), Aronsson
patent: 2002/0147693 (2002-10-01), Banerjee et al.
patent: 2003/0110380 (2003-06-01), Carolsfeld et al.
patent: 2005/0049801 (2005-03-01), Lindberg et al.
patent: 2005/0071128 (2005-03-01), Lindberg et al.
patent: 33 14 005 (1984-02-01), None
patent: 3915126 (1990-11-01), None
patent: 43 34 472 (1994-04-01), None
patent: 44 27 880 (1996-02-01), None
patent: 0 194 333 (1986-09-01), None
patent: 0 905 601 (1999-03-01), None
patent: 1 124 204 (2001-08-01), None
patent: 8-123868 (1996-05-01), None
patent: WO95/00930 (1995-01-01), None
patent: WO98/01831 (1998-01-01), None
patent: WO99/05486 (1999-02-01), None
patent: WO 01/14835 (2001-03-01), None
Symbol, PPT 4600 Series Pen Terminals with Integrated Scanners, Apr. 1996, 6 pages.
Dallas Semiconductor, DS2430A 256-Bit-1-Wire EEPROM, Apr. 3, 1995, pp. 235-250.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus for analysing the condition of a machine does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus for analysing the condition of a machine, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for analysing the condition of a machine will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3954234

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.