Apparatus for analysing surface properties with indirect...

Details Apparatus for analysing surface properties with indirect... Apparatus for analysing surface properties with indirect...

2007-09-21

2010-06-22

Epps, Georgia Y (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

C356S237200, C356S446000

Reexamination Certificate

active

07741629

ABSTRACT:
An apparatus (1) for analysing surface properties, comprising a first radiation device (4) which emits radiation directly onto a surface (9) to be analyzed, a first illumination device (6, 7) for indirectly illuminating the surface (9) to be analyzed, a first radiation detector device (8) which receives at least part of the radiation thrown back from the surface (9) to be analyzed and outputs at least one signal which is characteristic of this part of the radiation. According to the invention, a radiation scattering device (10, 11) is provided which is at least partially illuminated by the first illumination device (6, 7) and which transmits scattered radiation onto the surface (9) to be analyzed.

REFERENCES:
patent: 4113386 (1978-09-01), Lepper, Jr.
patent: 5111037 (1992-05-01), Boderie et al.
patent: 6738165 (2004-05-01), Sawada
patent: 7006229 (2006-02-01), Sperling et al.
patent: 2001/0030744 (2001-10-01), Chang
patent: 2006/0109473 (2006-05-01), Doak et al.

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