Apparatus for an anvil system that provides enhanced...

Details Apparatus for an anvil system that provides enhanced... Apparatus for an anvil system that provides enhanced...

2006-09-19

2006-09-19

Lefkowitz, Edward (Department: 2855)

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

Reexamination Certificate

active

07107857

ABSTRACT:
Apparatus for use in a conventional dynamic material testing system to advantageously provide uniform self-resistive specimen heating with enhanced temperature uniformity. Specifically, an anvil stack (300) in an anvil assembly (200) has a foil interface (242) with a composite layer (320A, 320B, 320C) containing, e.g., a concentrically oriented multi-component arrangement formed of an inner high strength and insulating disk (315, 325, 335) and an outer ring-shaped resistive region (313, 323, 333), situated between an anvil base (241) and an anvil top (240). An insulating member (243) electrically and thermally insulates all sides of the anvil stack from its supporting structure.

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U.S. Appl. No. 10/877,655, filed Jun. 25, 2004.

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