Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2009-11-25
2011-12-27
Phan, Huy Q (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755070, C324S755110
Reexamination Certificate
active
08085058
ABSTRACT:
An apparatus for adjusting a differential probe includes a regulator arranged therein capable of adjusting a distance between two tips of the probe. The probe is supported on the apparatus. The apparatus includes a rotatable shaft and a rotatable disk. The rotatable shaft engages with the regulator of the probe. The rotatable disk is mounted surrounding the rotatable shaft and rotatable together with the rotatable shaft. An angular ruler or a radian ruler is described on an outer surface of the rotatable disk to indicate a rotation angle or a rotation radian of the rotatable shaft, therefore the distance between the two tips of the probe are accurately adjusted.
REFERENCES:
patent: 6276956 (2001-08-01), Cook
patent: 6967473 (2005-11-01), Reed et al.
patent: 7212018 (2007-05-01), Annichiarico et al.
Chen Yung-Chieh
Hsu Shou-Kuo
Li Shen-Chun
Liang Hsien-Chuan
Altis Law Group, Inc.
Hon Hai Precision Industry Co. Ltd.
Nguyen Tung X.
Phan Huy Q
LandOfFree
Apparatus for adjusting differential probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for adjusting differential probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for adjusting differential probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4313328