Photocopying – Projection printing and copying cameras – Distortion introducing or rectifying
Reexamination Certificate
2006-09-27
2008-03-18
Kim, Peter B. (Department: 2851)
Photocopying
Projection printing and copying cameras
Distortion introducing or rectifying
C355S040000, C355S053000
Reexamination Certificate
active
07345735
ABSTRACT:
Aberrations in an optical system can be detected and measured using a method comprised of a test target in the object plane of a projection system and imaging a photoresist film with the system. The test target comprises at least one open figure which comprises a multiple component array of phase zones, where the multiple zones are arranged within the open figure so that their response to lens aberration is interrelated and the zones respond uniquely to specific aberrations depending on their location within the figure. This is a unique and new method of detecting a variety of aberration types including coma, spherical, astigmatism, and three-point through the exposure of a photoresist material placed in the image plane of the system and the evaluation of these images.
REFERENCES:
patent: 4641962 (1987-02-01), Sueda
patent: 5367404 (1994-11-01), Hayata
patent: 5828455 (1998-10-01), Smith
patent: 5978085 (1999-11-01), Smith
patent: 6248486 (2001-06-01), Dirksen
patent: 6368763 (2002-04-01), Dirksen
patent: 6552776 (2003-04-01), Wristers et al.
patent: 6839132 (2005-01-01), Fukuhara et al.
patent: 2002/0088951 (2002-07-01), Chen
patent: 2003/0091913 (2003-05-01), Shiode
patent: 2003/0098970 (2003-05-01), Chen
patent: 2003/0147061 (2003-08-01), Omura
patent: 2003/0203319 (2003-10-01), Lee
patent: 2003/0211700 (2003-11-01), Leung et al.
patent: 2000-146758 (2000-05-01), None
Hiscock & Barclay LLP
Kim Peter B.
LandOfFree
Apparatus for aberration detection and measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus for aberration detection and measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus for aberration detection and measurement will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3966776