X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-03-05
2008-08-12
Yun, Jurie (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S084000, C378S145000
Reexamination Certificate
active
07412030
ABSTRACT:
An apparatus directing x-rays along a predetermined axis includes an x-ray optic having one or more nested x-ray reflector rings positioned relative to a source generating broad spectrum x-rays so that generated x-rays moving away from the predetermined axis are collected by the reflector incident at or close to a Bragg angle to thereby reflect the collected x-rays into a conically parallel beam. A first diffractor is positioned relative to the x-ray optic to receive incident thereon the conically parallel beam, the first diffractor selected from a truncated cone and a cylinder and diffracting the conically parallel beam toward the predetermined axis. A second diffractor is positioned relative to the first diffractor and having a geometry effective to receive incident thereon and redirect the conically parallel beam along the predetermined axis as a collimated beam of substantially parallel x-rays.
REFERENCES:
patent: 6278764 (2001-08-01), Barbee et al.
Allen Dyer Doppelt Milbrath & Gilchrist, P.A.
Yun Jurie
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