Optics: measuring and testing – By dispersed light spectroscopy
Patent
1982-08-25
1985-03-12
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
356368, G01J 300
Patent
active
045041458
ABSTRACT:
Light from a light source emitting a line spectrum is passed through an absorbing cell. A metal element is enclosed in the absorbing cell, and the temperature of the absorbing cell is controlled to maintain a predetermined atomic vapor pressure of the metal element. This absorbing cell is disposed in the gap between the poles of an electromagnet. A linear polarizer is disposed between the light source and the absorbing cell. Light passed through the absorbing cell is led via a spectroscope toward a light sensor. While the light is being directed from the light source toward the absorbing cell, the value of current supplied to the electromagnet is changed to vary the intensity of the magnetic field. With the field intensity variation, the wavelength of a component split from the absorption line of the atomic vapor in the absorbing cell is shifted. This wavelength-shifted component is scanned along the wavelength of the line spectrum emitted from the light source, whereby the profile of the emission line spectrum can be measured.
REFERENCES:
van Heek, Spectrochimica Acta, vol. 25B, No. 2, Feb. 1970, pp. 107-109.
Evans F. L.
Hitachi , Ltd.
LandOfFree
Apparatus capable of measurement of profile of emission line spe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus capable of measurement of profile of emission line spe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus capable of measurement of profile of emission line spe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-705054