Radiant energy – Invisible radiant energy responsive electric signalling – With means to inspect passive solid objects
Patent
1984-05-30
1986-05-20
Howell, Janice A.
Radiant energy
Invisible radiant energy responsive electric signalling
With means to inspect passive solid objects
250372, G01F 2300
Patent
active
045903760
ABSTRACT:
An instrument for monitoring the surface characteristics of materials, whereby the surface is characterized by measurement of a current of photo-emitted electrons flowing from the surface to a collector on the instrument. The instrument directs ultra violet light against the surface being measured, and the photoelectrons emitted are characteristic of surface features such as oxide thickness, contamination, or fatigue. The current of electrons emitted from the surface is compared with previously established limits for surface quality to provide an acceptability test of the surface. The instrument is portable and does not require the use of a vacuum chamber.
REFERENCES:
patent: 3549999 (1970-12-01), Norton
patent: 4278508 (1981-07-01), White et al.
patent: 4352017 (1982-09-01), Duffy et al.
patent: 4393348 (1983-07-01), Goldstein et al.
patent: 4447151 (1984-05-01), McLellan et al.
patent: 4464627 (1984-08-01), Munakata et al.
Surface Quality Unit for Inspection by Nondestructive Testing (SQUINT), by Tennyson Smith--published in the National SAMPE Technical Conference, Cincinnati, Fall 1983.
Detecting Contamination with Photoelectron Emission--(Marshall Space Flight Center, Alabama) NASA Tech Briefs, Fall/Winter 1981.
Photoelectron Emission from Aluminum and Nickel Measured in Air Tennyson Smith--Journal of Applied Physics, vol. 46, No. 4, Apr. 1975.
Residual Silicone Detection--Final Report Draft for the Period Nov. 13, 1979-Jul. 12, 1979--Contract No. NAS8-33694 Tennyson Smith-Principal Investigator/Rockwell International Science Center.
Howell Janice A.
Photo Acoustic Technology, Inc.
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