Apparatus and process for testing AC performance of LSI componen

Details Apparatus and process for testing AC performance of LSI componen Apparatus and process for testing AC performance of LSI componen

1975-04-29

1977-11-15

Rolinec, Rudolph V.

Electricity: measuring and testing

Plural, automatically sequential tests

324 73AT, 235302, 2353041, G01R 1512

Patent

active

040587673

ABSTRACT:
Apparatus for determining the AC or switching delay behavior of an LSI circuit. The apparatus measures the signal propagation along different circuit paths to determine the AC characteristic. Each LSI circuit line under test is connected to a display through a line counter logic block. Each line counter logic block responds to a begin count pulse, counter pulses and stop or reset pulses. The logic block provides numerical count to the display until the line under test switches. The numerical counts on the display for the various lines indicates the AC performance of each circuit as they respond to input data over a selected timing interval.

REFERENCES:
patent: B394712 (1975-01-01), Patti
patent: 3673397 (1972-06-01), Schaefer
patent: 3740646 (1973-06-01), McMahon, Jr.
patent: 3812426 (1974-05-01), Illian
patent: 3832535 (1974-08-01), De Vito
patent: 3883801 (1975-05-01), Hess
patent: 3887869 (1975-06-01), Connolly et al.

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