Apparatus and process for improved detection limits in mass spec

Details Apparatus and process for improved detection limits in mass spec Apparatus and process for improved detection limits in mass spec

1988-03-02

1989-08-08

Howell, Janice A.

Radiant energy

Ionic separation or analysis

Methods

250281, 250288, B01D 5944

Patent

active

048555940

ABSTRACT:
A system and method for detecting trace levels of a sample gas in a mass spectrometer having a vacuum chamber with a vacuum pump, an ionizer, extracting and imaging lens and a detector. A high pressure sample gas pulse is introduced into the vacuum chamber through a small orifice to produce a high density of sample gas in a region near the orifice. The density of the sample gas pulse is sufficient to substantially sweep residual background gas from the path of the pulse. A portion of the sample gas pulse is ionized and ions are extracted and imaged.

REFERENCES:
patent: 3920986 (1975-11-01), Fies, Jr.
patent: 3974380 (1976-08-01), Rettinghaus et al.
patent: 4018241 (1977-04-01), Sodal et al.
patent: 4039828 (1977-08-01), Pokar et al.
patent: 4258257 (1981-03-01), Brackmann
patent: 4263507 (1981-04-01), Schmidt
patent: 4365157 (1982-12-01), Unsold et al.
patent: 4730111 (1988-03-01), Vestal et al.
Lyubimov et al.-JETP Letters-Soviet 1968 , p. 49.
PCT Publication WO81/02366-Rosengren et al.-8/21/81

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