Apparatus and process for characterizing samples

Details Apparatus and process for characterizing samples Apparatus and process for characterizing samples

2007-04-17

2007-04-17

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

For refractive indexing

Reexamination Certificate

active

10861673

ABSTRACT:
An apparatus and method for measuring by the Schlieren technique light beam deviations generated by a sample (EV) includes a source (S) of light beam for illuminating the sample (EV) therewith so as to have a transmitted beam. An imaging means is provided (L2, L3) for forming an image of the sample from the transmitted beam. A filtering means acts as a Schlieren filter (SF) for obtaining “Schlieren fringes” from the image. The Schlieren filter (SF) comprises a periodic structure (SFP) of a defined period. A detecting means (CCD) is provided for detecting the Schlieren fringes under operating conditions. The apparatus can also include means to shift the filtering means with a shift φ by a fraction of the period of the periodic structure thereby shifting the Schlieren fringes, means to acquire a set of at least three successive phase-shifted images; means for reconstructing a mean image of the sample from said collected phase-shifted images using a phase-shifting algorithm used in interferometry, and processing means to calculate by said phase-shifting analysis the optical characteristics, angle and phase of the transmitted beam from said reconstructed image so as to determine the beam deviation angle generated by the sample.

REFERENCES:
patent: 2883900 (1959-04-01), Svensson
patent: 2977847 (1961-04-01), Meyer-Arendt
patent: 2998719 (1961-09-01), Rubin
patent: 5515158 (1996-05-01), Heineck
International Search Report dated Dec. 6, 2003 for International Application No. PCT/BE02/00184, filed Dec. 5, 2002, now International Publication No. WO 03/048837.

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