Apparatus and methods of integrated-circuit device testing

Details Apparatus and methods of integrated-circuit device testing Apparatus and methods of integrated-circuit device testing

2011-01-18

2011-01-18

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

07872469

ABSTRACT:
A motherboard device (MB) interface board (DIB) configured as universal interface to a family of integrated circuit (IC) devices provides the electrical connectivity to automated test equipment (ATE) and physical mating commonality with an IC device handler for reduced time to market and enhanced economy for design validation and production verification testing. In particular, use of one or more daughter cards (DC) that mount to the MB DIB avoid redesign of the entire DIB assembly for a new IC design. Each DC can be more quickly designed at a lower cost than the entire DIB assembly, enabling replacement of any defective site. The DC increases the available surface area for mounting of support components for the device under test (DUT).

REFERENCES:
patent: 7138811 (2006-11-01), Mahoney et al.
patent: 7307433 (2007-12-01), Miller et al.
patent: 7535244 (2009-05-01), Kim

Affiliated with

Also associated with

Rating

Apparatus and methods of integrated-circuit device testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and methods of integrated-circuit device testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and methods of integrated-circuit device testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2742379