Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2008-07-14
2011-11-01
Toatley, Gregory J (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
08049900
ABSTRACT:
A method and a system for Uniform Frequency Sample Clocking to directly sample the OCT signal with a temporally-non-linear sampling clock derived from a k-space wavemeter on the external sample clock input port of a digitizer. The Uniform Frequency Sample Clocking comprises at least one Pathway, which includes characterizing the swept light source, creating a digital representation of the waveform based from the characterization data, and generating a clock signal using a waveform generator to output the clock signal to a digitizer external clock.
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Kemp Nathaniel J.
Kuranov Roman
McElroy Austin Broderick
Milner Thomas E.
Brown Rudnick LLP
Meyers Thomas
Richey Scott
Toatley Gregory J
Tosti Robert
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