Apparatus and methods for uniform frequency sample clocking

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Reexamination Certificate

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08049900

ABSTRACT:
A method and a system for Uniform Frequency Sample Clocking to directly sample the OCT signal with a temporally-non-linear sampling clock derived from a k-space wavemeter on the external sample clock input port of a digitizer. The Uniform Frequency Sample Clocking comprises at least one Pathway, which includes characterizing the swept light source, creating a digital representation of the waveform based from the characterization data, and generating a clock signal using a waveform generator to output the clock signal to a digitizer external clock.

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