Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-02-20
2007-02-20
Mehta, Bhavesh M. (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S199000, C382S209000, C382S242000, C382S266000, C348S125000
Reexamination Certificate
active
10706440
ABSTRACT:
A method for inspecting electrical circuits, and a system for carrying out the method, generating a representation of boundaries of elements in an image of an electrical circuit which is under inspection, and analyzing at least some locations of at least some boundaries in the representation of boundaries of elements to identify defects in the electrical circuit.
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Duvdevani Sharon
Gilat-Bernshtein Tally
Klingbell Eyal
Mayo Meir
Rippa Shmuel
Ladas and Parry LLP
Mehta Bhavesh M.
Orbotech Ltd.
Seth Manav
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