Electrical connectors – With coupling movement-actuating means or retaining means in... – Having push-pull contacts spaced along only one planar side...
Patent
1998-01-20
2000-09-26
Luebke, Renee S.
Electrical connectors
With coupling movement-actuating means or retaining means in...
Having push-pull contacts spaced along only one planar side...
439352, 439310, 324538, H01R 13625
Patent
active
061235644
ABSTRACT:
A series of modular plugs insertable into a row of connector sockets mounted on a circuit board to be tested are secured to a specially designed support structure which enables the plugs to be simultaneously mated with the sockets to thereby substantially reduce the required test connection time and to enable the plugs to be coupled with and uncoupled from the sockets without subjecting the plug cables to appreciable handling stress. In one embodiment thereof the support structure may be manually moved toward the sockets to effect the coupling of the plugs with their sockets, and a movable latch plate member is carried by the support structure for use in simultaneously unlatching the inserted plugs from their sockets. In another embodiment thereof the support structure is stationarily secured to a specially designed test stand assembly which is operable to move the circuit board toward the stationary plugs to effect the desired plug/socket test interconnection.
REFERENCES:
patent: 5191282 (1993-03-01), Liken et al.
patent: 5411416 (1995-05-01), Balon et al.
patent: 5415570 (1995-05-01), Sarkissian
patent: 5689191 (1997-11-01), Kahiyama
patent: 5743755 (1998-04-01), Aoki
patent: 5795174 (1998-08-01), Saito et al.
Compaq Computer Corporation
Luebke Renee S.
Patel T. C.
LandOfFree
Apparatus and methods for testing electronic circuitry with mult does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and methods for testing electronic circuitry with mult, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and methods for testing electronic circuitry with mult will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2095194