Apparatus and methods for surface contour measurement

Optics: measuring and testing – Shape or surface configuration – Triangulation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S601000, C356S614000, C250S23700G

Reexamination Certificate

active

11128114

ABSTRACT:
Apparatus and methods of measuring three-dimensional position information of a onto a surface of an object including two sources of radiation separated by a distance, each source having a spectral distribution, and being coherent with respect to the other of the sources, a control system moving each of the sources relative to the other of the sources, and a detector positioned to receive radiation scattered from the point on the surface of the object. In another embodiment, the two sources of radiation include, an initial source of a beam of radiation having a spectral width, a beam separator in optical communication with the initial source of a beam of radiation generating a first optical beam and a second optical beam, and an imaging system optically connected to the beam separator.

REFERENCES:
patent: 3994589 (1976-11-01), Nodwell et al.
patent: 4030830 (1977-06-01), Holly
patent: 4139304 (1979-02-01), Redman et al.
patent: 4298286 (1981-11-01), Maxey et al.
patent: 4349277 (1982-09-01), Mundy et al.
patent: 4499492 (1985-02-01), Hutchin
patent: 4564295 (1986-01-01), Halioua
patent: 4641972 (1987-02-01), Halioua et al.
patent: 4781455 (1988-11-01), Machler et al.
patent: 4832489 (1989-05-01), Wyant et al.
patent: 5003187 (1991-03-01), Zumbrunn et al.
patent: 5135308 (1992-08-01), Kuchel
patent: 5146293 (1992-09-01), Mercer et al.
patent: 5289264 (1994-02-01), Steinbichler
patent: 5455670 (1995-10-01), Payne et al.
patent: 5621529 (1997-04-01), Gordon et al.
patent: 5640239 (1997-06-01), Takamiya et al.
patent: 5666197 (1997-09-01), Guerra
patent: 5682236 (1997-10-01), Trolinger et al.
patent: 5796459 (1998-08-01), Bryan-Brown et al.
patent: 6049384 (2000-04-01), Rudd et al.
patent: 6100977 (2000-08-01), Muller
patent: 6438272 (2002-08-01), Huang et al.
patent: 2001/0012388 (2001-08-01), Muller et al.
patent: 25 54 086 (1977-06-01), None
patent: 28 50 092 (1980-05-01), None
patent: 44 04 663 (1995-08-01), None
patent: 44 15 834 (1995-11-01), None
patent: 44 15 834 (1995-11-01), None
patent: 195 43 347 (1997-05-01), None
patent: 0 864 847 (1998-09-01), None
patent: 0 864 847 (1998-09-01), None
patent: 2 595 815 (1987-09-01), None
patent: 2142427 (1985-01-01), None
patent: 58173412 (1983-10-01), None
patent: 61198009 (1986-09-01), None
patent: 97/29341 (1997-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and methods for surface contour measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and methods for surface contour measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and methods for surface contour measurement will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3734000

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.