Apparatus and methods for surface contour measurement

Computer graphics processing and selective visual display system – Display driving control circuitry – Controlling the condition of display elements

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356357, 356358, 356359, 356349, 356376, G01B 902, G01B 1124

Patent

active

058701915

ABSTRACT:
Apparatus and methods of measuring position information, typically the depth coordinate, of a point on the surface of an object. In one embodiment, the apparatus includes two sources of radiation positioned to illuminate the point on the surface of the object with radiation from each of the sources. The radiation from each of the sources is coherent with respect to the radiation from the other source. A control system changes the phase of the radiation from at least one of the sources relative to the phase of the radiation from the other source as measured at the point on the surface of the object. A detector is positioned to receive radiation scattered by the point and a processor, in communication with the detector, calculates position information in response to the change in phase of the radiation from the source and the received radiation scattered by the point on the surface of the object.

REFERENCES:
patent: 4139304 (1979-02-01), Redman et al.
patent: 4781455 (1988-11-01), Machler et al.
patent: 4832489 (1989-05-01), Wyant et al.
patent: 5455670 (1995-10-01), Payne et al.
Butters, Von J. N., "Using the Laser to Measure Length," Materialpruf, 24:245-248 (Jul. 7, 1982).
Zou et al., "Two-Wavelength DSPI Surface Contouring Through the Temperature Modulation of a Laser Diode," Optik, 94(4):155-158 (1993).
Peng et al., "A Simplified Multi-Wavelength ESPI Contouring Technique Based on a Diode Laser System," Optik, 91(2)81-85 (1992).
Fercher et al., "Two-Wavelength Speckle Interferometric Technique for Rough Face Contour Measurement," Optical Engineering, 25(5):623-626 (May 1986).
Fercher et al., "Rough Surface Interfermotery with a Two-Wavelength Heterodyne Speckle Interferometer," Applied Optics, 24(14):2181-1288 (Jul. 15, 1985).
Thalmann et al., "Dimensional Profiling by Electronic Phase Measurement," SPIE Industrial Laser Interferometry, 746:61-68 (1987).
Takeda et al., "Fourier-Transform Speckle Profilometry: Three-Dimensional Shape Measurements of Diffuse Objects with Large Height Steps and/or Spatially Isolated Surfaces," Applied Optics, 33(34):7829-7837 (Dec. 1, 1994).
Volotovskaya, N.K., "Relationship Between the Frequency and Angular Correlation Function of a Signal that is Scattered by an Extensive Body," Radio Engineering and Electronic Physics J. 16(6):1048-1049 (Jun. 1971).
Dresel et al., "Three-Dimensional Sensing of Rough Surfaces by Coherence Radar," Applied Optics, 31(7):919-925 (Mar. 1, 1992).
Shirley et al., "Advanced Techniques for Target Discrimination Using Laser Speckle," Massachusetts Institute of Technology, The Lincoln Laboratory J., 5(3):367-440 (1992).
Shirley, L. G., "Applications of Tunable Lasers to Laser Radar and 3D Imaging," Technical Report 1025, Massachusetts Institute of Technology, Lincoln Laboratory, (1995).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and methods for surface contour measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and methods for surface contour measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and methods for surface contour measurement will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1954427

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.