Apparatus and methods for spectral analysis of electrical materi

Details Apparatus and methods for spectral analysis of electrical materi Apparatus and methods for spectral analysis of electrical materi

1988-08-04

1991-02-05

Lall, Parshotam S.

Boots, shoes, and leggings

364480, 364481, G01R 2900

Patent

active

049911287

ABSTRACT:
Measurements of complex permittivity using transient techniques and Fourier transforms require computation which can be lengthy. In the invention, a synthesizer generates a succession of waveforms each containing a small number of harmonically related frequency components. These waveforms are applied to a capacitive potentiometer formed by a reference capacitor and a sample head. The voltages across the potentiometer and the sample head are passed by way of an analog-to-digital converter to a microprocessor which calculates Fourier transforms and indicates permittivity versus frequency. By limiting the frequency components, the computation time is reduced and a quick scan to find spectral regions of interest is possible. These regions can then be examined at higher resolution by changing a clock frequency which determines the generation of the frequency components.

REFERENCES:
patent: 4067060 (1978-01-01), Poussart et al.
patent: 4286326 (1981-08-01), Houdard
patent: 4301404 (1981-11-01), Ley
patent: 4402054 (1983-08-01), Osborne et al.
patent: 4607216 (1986-08-01), Yamaguchi et al.

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