Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-08-15
2006-08-15
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07091737
ABSTRACT:
A method includes installing a device under test (DUT) into each of a plurality of burn-in boards. The method further includes docking each of the burn-in boards to a respective docking location, each of the burn-in boards with a single respective DUT installed therein. The method further includes subjecting the DUTs to a self-heating burn-in procedure while the burn-in boards are docked to the docking locations. Other embodiments are described and claimed.
REFERENCES:
patent: 5788084 (1998-08-01), Onishi et al.
patent: 5966021 (1999-10-01), Eliashberg et al.
patent: 6043671 (2000-03-01), Mizuta
patent: 6104183 (2000-08-01), Kobayashi et al.
patent: 6157201 (2000-12-01), Leung, Jr.
Buckley Maschoff & Talwalkar LLC
Intel Corporation
Nguyen Tung X.
Patel Paresh
LandOfFree
Apparatus and methods for self-heating burn-in processes does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and methods for self-heating burn-in processes, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and methods for self-heating burn-in processes will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3635513