Apparatus and methods for performing a test

Details Apparatus and methods for performing a test Apparatus and methods for performing a test

2008-12-17

2010-06-22

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010

Reexamination Certificate

active

07741863

ABSTRACT:
A circuit structure has a circuit portion with negative resistance and a test resonator structure. Furthermore, the circuit structure has a unit for coupling the test resonator structure to the circuit portion with negative resistance during testing and for decoupling the test resonator structure from the circuit portion with negative resistance after testing.

REFERENCES:
patent: 3150021 (1964-09-01), Sato
patent: 3577146 (1971-05-01), Freier et al.
patent: 3599197 (1971-08-01), Boyko
patent: 4630003 (1986-12-01), Torizuka et al.
patent: 5157356 (1992-10-01), Wedge
patent: 5376902 (1994-12-01), Bockelman et al.
patent: 5578970 (1996-11-01), Nguyen et al.
patent: 5886591 (1999-03-01), Jean et al.
patent: 6054948 (2000-04-01), Dean
patent: 6204739 (2001-03-01), Sakamoto et al.
patent: 6545550 (2003-04-01), Frerking
patent: 6756857 (2004-06-01), Aikawa et al.
patent: 7031689 (2006-04-01), Frank
patent: 7119745 (2006-10-01), Gaucher et al.
patent: 7215201 (2007-05-01), Roine
patent: 7482972 (2009-01-01), Forstner et al.
patent: 2002/0006676 (2002-01-01), Debenham et al.
patent: 2005/0212090 (2005-09-01), Friedrich et al.
patent: 2006/0049979 (2006-03-01), Miosga et al.
patent: 2006/0119530 (2006-06-01), Kronberger
patent: 2007/0275687 (2007-11-01), Forstner et al.
patent: 2008/0001810 (2008-01-01), Forstner et al.
patent: 100 26 277 (2001-12-01), None
patent: 1 024 590 (2000-02-01), None
patent: 1 231 825 (2002-08-01), None
patent: WO 98/16848 (1998-04-01), None
patent: WO 03/100456 (2003-12-01), None
Srikanth et al. Radio-Frequency impedance measurements using a tunnel-diode oscillator technique, Jul. 1999, Review of Sientific Instruments, vol. 70, No. 7.
“Single-Chip Coplanar 94-GHz FMCW Radar Sensors”, William H. Haydl, Markus Neumann, Ludger Verweyen, Axel Bangert, Steffen Kudszus, Michael Schlechtweg, Axel Hülsmann, Axel Tessmann, Werner Rienert and Tobia Krems, IEEE Microwave and Guided Wave Letters, vol. 9, No. 2, Feb. 1999, 3 pgs.
“An RFOW Testable DRO for use Within a Complete MMIC Low Noise Downconverter”, A.W. Dearn, 4 pgs., date not available.
Okazaki et al. Wide-band SSB subharmonically pumped mixer MMIC, Okazaki, H.; Yamaguchi, Y.; Microwave Theory and Techniques, IEEE Transactions on vol. 45, Issue 12, Part 2, Dec. 1997 pp. 1035-1038.
Non-Final Office Action dated Jun. 3, 2008 for U.S. Appl. No. 11/427,847.
Non-Final Office Action dated Apr. 17, 2009 for U.S. Appl. No. 11/427,852.
Non-Final Office Action dated Apr. 3, 2008 for U.S. Appl. No. 11/427,858.
Notice of Allowance dated Oct. 16, 2008 for U.S. Appl. No. 11/427,847.
Notice of Allowance dated Sep. 25, 2008 for U.S. Appl. No. 11/427,858.
Notice of Allowance dated Oct. 21, 2009 issued to U.S. Appl. No. 11/427,852.

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