Apparatus and methods for obtaining increased sensitivity, selec

Details Apparatus and methods for obtaining increased sensitivity, selec Apparatus and methods for obtaining increased sensitivity, selec

1997-05-09

1999-11-23

Strecker, Gerard

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324232, 324243, 324452, 324629, 324674, G01R 3312, G01R 2700, G01N 2772

Patent

active

059906774

ABSTRACT:
Apparatus and methods are disclosed which provide increased sensitivity, selectivity and dynamic range for non-contact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application. A measurement apparatus for measuring one or more MUT properties includes an electromagnetic winding structure which, when driven by an electric signal, imposes a magnetic field in the MUT and senses an electromagnetic response. An analyzer is provided for applying the electric signal to the winding structure. A property estimator is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.

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