Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2008-04-17
2011-10-25
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
08045177
ABSTRACT:
An apparatus and method according to an exemplary embodiment of to the present invention can provide imaging information associated with at least one portion of a sample. For example, at least two first different wavelengths of at least one first electro-magnetic radiation within a first wavelength range may be provided on the portion of the sample so as to determine at least one first transverse location of the portion. At least two second different wavelengths of at least one second electro-magnetic radiation may also be provided within a second wavelength range provided on the portion so as to determine at least one second transverse location of the portion. It is possible to obtain a relative phase between at least one third electro-magnetic radiation electro-magnetic radiation being returned from the sample and at least one fourth electro-magnetic radiation returned from a reference to determine a motion of the portion or of particles within or on the portion, whereas the motion is effectuated by at least one of a sound wave. Further, the imaging information of the portion can be provided based on the first transverse location, the second transverse location and the motion.
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Bouma Brett Eugene
Merchant Saumil
Rosowski John
Tearney Guillermo J.
Yelin Dvir
Chowdhury Tarifur
Dorsey & Whitney LLP
Hansen Jonathan
Massachusetts Eye and Ear Infirmary
The General Hospital Corporation
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