Apparatus and methods for measuring the dielectric and geometric

Details Apparatus and methods for measuring the dielectric and geometric Apparatus and methods for measuring the dielectric and geometric

1991-05-28

1993-06-29

Harvey, Jack B.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324690, 324688, G01R 2726

Patent

active

052237966

ABSTRACT:
Apparatus and methods for measuring the properties of a material by employing a driven electrode, a sensing electrode and a shunting electrode. The shunting electrode is disposed in proximity to the driven and sensing electrodes and functions to increase the sensitivity of electrical measurements made between the driven and sensing electrodes by influencing the coupling of the imposed electric field to the sensing electrode to a degree related to the properties of the material under test.

REFERENCES:
patent: 3231815 (1966-01-01), Spencer
patent: 3515987 (1970-06-01), Zurbrick et al.
patent: 3826979 (1974-07-01), Steinmann
patent: 4555941 (1985-12-01), Fathauer et al.
patent: 4559493 (1985-12-01), Goldberg et al.
patent: 4560923 (1985-12-01), Hanson
patent: 4751842 (1988-06-01), Ekrann et al.
patent: 4757252 (1988-07-01), Maltby et al.
patent: 4845421 (1989-07-01), Howarth et al.
patent: 4899101 (1990-02-01), Porges
patent: 4908574 (1990-03-01), Rhoades et al.
patent: 4972154 (1990-11-01), Bechtel et al.
patent: 4992741 (1991-02-01), Douglas et al.
patent: 5025222 (1991-06-01), Scott et al.
patent: 5045798 (1991-09-01), Hendrick
patent: 5568874 (1986-02-01), Kramer et al.

Affiliated with

Also associated with

Rating

Apparatus and methods for measuring the dielectric and geometric does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and methods for measuring the dielectric and geometric, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and methods for measuring the dielectric and geometric will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1758283