Apparatus and methods for measuring permittivity in materials

Details Apparatus and methods for measuring permittivity in materials Apparatus and methods for measuring permittivity in materials

1987-10-02

1989-03-21

Eisenzopf, Reinhard J.

Electricity: measuring and testing

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34087037, G01R 2726, G08C 1910, G08C 1916

Patent

active

048146900

ABSTRACT:
Devices and analytical techniques are disclosed for measuring the spatial profile of permittivity of a material by multiple wavenumber interrogations. Electrode structures are disclosed which define a number of different fundamental wavelengths (or wavenumbers). Spatially periodic interrogation signals (of temporary frequency ".omega.") from the electrode structures are attenuated to varying degrees by the material undergoing analysis, depending upon the wavenumber ("k"), thereby permitting the derivation of a composite dielectric profile.

REFERENCES:
patent: 4058766 (1977-11-01), Vogel et al.
patent: 4399100 (1983-08-01), Zsolnay et al.
patent: 4423371 (1983-12-01), Senturia et al.
patent: 4496697 (1985-01-01), Zsolnay et al.
Zaretsky et al., Lees Technical Report, pp. 1-43, Jul. 1986.

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