Apparatus and methods for making spectroscopic measurements...

Electricity: measuring and testing – Electric lamp or discharge device – Electric lamp

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S122000

Reexamination Certificate

active

07323877

ABSTRACT:
Apparatus and methods are disclosed for measuring cathode fall within a fluorescent lamp that contains an electrode and a gas. A level of cathode fall associated with the electrode may be identified based on an intensity and wavelength of radiation emitted by the gas.

REFERENCES:
patent: 4638215 (1987-01-01), Schmid et al.
patent: 4751426 (1988-06-01), Hoffman et al.
patent: 5103133 (1992-04-01), Misono
patent: 5367223 (1994-11-01), Eccher
patent: 5424611 (1995-06-01), Moriarty, Jr.
patent: 5475284 (1995-12-01), Lester et al.
patent: 5703441 (1997-12-01), Steigerwald et al.
patent: 5834908 (1998-11-01), Boland et al.
patent: 5952832 (1999-09-01), Stevanovic et al.
patent: 6243017 (2001-06-01), Kuisma
patent: 6538448 (2003-03-01), Tabell
patent: 6583573 (2003-06-01), Bierman
patent: 6693944 (2004-02-01), Hug et al.
patent: 6864685 (2005-03-01), Otsuka et al.
patent: 2004/0100194 (2004-05-01), Eden, et al.
patent: 2005/0012468 (2005-01-01), Ryu et al.
Hammer, E.E., “Cathode Fall Relationship in Fluorescent Lamps”,IESNA Conference, Miami Beach FL, 1994, (Published Version)- JIES Winter 1995, 116-122.
Hammer, E.E., “Comparative Starting-Operating Characteristics in Typical F40 Systems”,IESNA Conference Minneapolis MN, 1988, (Published version)- JIES Winter 1989, 63-69.
Ligthart, F.S. et al.,5thInternational Symposium on Science and Technology of Light Sources, 1989, Paper 17L, York England.
Waymouth, J.F., “Electric Discharge Lamps”, 1971,Mit Press, Chapter IV, 70-113 and Appendix B, “Probe Measurements in Plasmas”, 338-345.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and methods for making spectroscopic measurements... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and methods for making spectroscopic measurements..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and methods for making spectroscopic measurements... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3962942

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.