Apparatus and methods for inspection of electrical materials and

Details Apparatus and methods for inspection of electrical materials and Apparatus and methods for inspection of electrical materials and

1987-06-12

1989-03-28

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Combined with diverse-type device

250572, 324456, H01J 4014

Patent

active

048166669

ABSTRACT:
A capacitor has a top plate 2 in the form of a photodiode array and a bottom plate 2. An RF source 3 is connected between plates 1 and 2. Insulating or semiconducting material to be tested is inserted between the plates 1 and 2 to act as dielectric. Where a printed circuit board or other conductive electrical component is to be tested it forms top plate 2. A flying spot scanner 11 produces a modulated light beam 12 which scans the top surface of plate 2. The resulting modulated photocurrent envelope is detected and displayed in a display monitor 15 in synchronism with the scanning beam.

REFERENCES:
patent: 4208624 (1980-06-01), Miller
patent: 4443764 (1984-04-01), Suh et al.
Patent Abstracts of Japan, vol. 5, No. 38(P-52), 12th Mar. 1981; of Application No. 54-7531, published Dec. 1980.

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