Apparatus and methods for fourier spectral analysis in a...

Details Apparatus and methods for fourier spectral analysis in a... Apparatus and methods for fourier spectral analysis in a...

2005-02-08

2005-02-08

Smith, Zandra V. (Department: 2877)

Optics: measuring and testing

By light interference

Spectroscopy

C356S491000

Reexamination Certificate

active

06853455

ABSTRACT:
A scanning spot microscope for performing a Fourier spectral analysis has means for performing a repeatable scanning operation which includes scanning an incident light spot to successive locations of a specimen. An interferometer is placed across an optical light path of the microscope, the interferometer including a birefringent device between polarizing devices in the path and introducing a given path difference. Means are provided for receiving and recording an optical signal due to the incident light spot from each successive specimen location. In use the given path difference is maintained during each scanning operation but is varied between scanning operations so that the optical signals relating to these specimen locations and the values of the given path difference can be recorded.

REFERENCES:
patent: 4905169 (1990-02-01), Buican
patent: 5117466 (1992-05-01), Buican
patent: 5457536 (1995-10-01), Kornfield
patent: WO 9418593 (1994-08-01), None
patent: WO 9723649 (1997-07-01), None
Patent Abstracts of Japan, vol. 097, No. 008, Aug. 29, 1997 & JP 09 096764 A (Olympus Optical Co Ltd), Apr. 8, 1997, see abstract.

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