Apparatus and methods for directly measuring the refraction of t

Optics: eye examining – vision testing and correcting – Spectacles and eyeglasses – Folding

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351 13, 351 14, 351 39, A61B 310

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041628284

ABSTRACT:
Optometer apparatus for directly measuring the refraction of the eye and methods therefor are provided in accordance with the teachings of the present invention. According to an exemplary embodiment of the present invention, a double slit, Scheiner principle projection system is employed to project an image upon the retina. The retinal image is then focused upon an optoelectric, linear sensor which provides an output corresponding to the intensity gradient of the retinal image focused thereon. The output of the optoelectric, linear sensor may then be employed as a measure of the refraction of the eye.

REFERENCES:
patent: 3136839 (1964-06-01), Safir
patent: 3536383 (1970-10-01), Cornsweet et al.
patent: 3715166 (1973-02-01), Leighty et al.
patent: 3888569 (1975-06-01), Munnerly et al.
Niles Roth, "Recording . . . Optometer," Am. J. Optom & Arch . . . , vol. 39, No. 7, pp. 356-361, Jul. 1962.
F. W. Campbell et al., "High . . . Optometer," JOSA, vol. 49, No. 3, Mar. 1959, pp. 268-272.
J. Warshawsky, "High . . . Accommodation", JOSA, vol. 54, No. 3, Mar. 1964, pp. 375-379.
Charles Riva, "New . . . Reflectometer", Applied Optris, vol. 11, No. 8, Aug. 1972, pp. 1845-1848.

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