Apparatus and methods for detecting overlay errors using...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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C356S601000, C356S620000, C356S625000, C438S401000, C257S797000

Reexamination Certificate

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10785732

ABSTRACT:
Disclose is a combined scatterometry mark comprising a scatterometry critical dimension (CD) or profile target capable of being measured to determine CD or profile information and a scatterometry overlay target disposed over the scatterometry CD or profile target, the scatterometry overlay target cooperating with the scatterometry CD or profile target to form a scatterometry mark capable of being measured to determine overlay.

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