Apparatus and methods for contour measurement using movable sour

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356357, G01B 1124

Patent

active

060316128

ABSTRACT:
Apparatus and methods of measuring position information of a point on the surface of an object. In one embodiment, the apparatus includes two sources of radiation positioned to illuminate the point on the surface of the object with radiation from each of the sources. The radiation from each of the sources is coherent with respect to the radiation from the other source. A control system moves each of the sources relative to the other and changes the phase of the radiation from at least one of the sources relative to the phase of the radiation from the other source as measured at the point on the surface of the object. A detector is positioned to receive radiation scattered by the point and a processor in communication with the detector calculates position information in response to the change in phase of the radiation from the source and the received radiation scattered by the point on the surface of the object.

REFERENCES:
patent: 4139304 (1979-02-01), Redman et al.
patent: 4349277 (1982-09-01), Mundy et al.
patent: 4499492 (1985-02-01), Hutchin
patent: 4781455 (1988-11-01), Machler et al.
patent: 4832489 (1989-05-01), Wyant et al.
patent: 5146293 (1992-09-01), Mercer et al.
patent: 5289264 (1994-02-01), Steinbichler
patent: 5455670 (1995-10-01), Payne et al.
Fercher, A.F., Two-wavelength speckle interferometric techique for rough surface contour measurement, Optical Engineering, May 1986, pp. 623-626.
Butters, Von J. N., "Using the Laser to Measure Length," Materialpruf, 24:245-248 (Jul. 7, 1982) (German Abstract).
Zou et al., "Two-Wavelength DSPI Surface Contouring Through the Temperature Modulation of a Laser Diode," Optik, 94(4):155-158 (1993).
Peng et al., "A Simplified Multi-Wavelength ESPI Contouring Technique Based on a Diode Laser System,"Optik, 91(2)81-85 (1992).
Fercher et al., "Two-Wavelength Speckle Interferometric Technique for Rough Face Contour Measurement," Optical Engineering, 25(5):623-626 (May 1986).
Fercher et al., "Rough Surface Interferometry with a Two-Wavelength Heterodyne Speckle Interferometer," Applied Optics, 24(14):2181-1288 (Jul. 15, 1985).
Thalmann et al., "Dimensional Profiling by Electronic Phase Measurement," SPIE Industrial Laser Interferometry, 746:61-68 (1987).
Takeda et al., "Fourier-Transform Speckle Profilometry: Three-Dimensional Shape Measurements of Diffuse Objects with Large Height Steps and/or Spatially Isolated Surfaces," Applied Optics, 33(34):7829-7837 (Dec. 1, 1994).
Volotovskaya, N.K., "Relationship Between the Frequency and Angular Correlation Function of a Signal that is Scattered by an Extensive Body," Radio Engineering and Electronic Physics J. 16(6):1048-1049 (Jun. 1971).
Dresel et al., "Three-Dimensional Sensing of Rough Surfaces by Coherence Radar," Applied Optics, 31(7):919-925 (Mar. 1, 1992).
Shirley et al., "Advanced Techniques for Target Discrimination Using Laser Speckle," Massachusetts Institute of Technology, The Lincoln Laboratory J., 5(3):367-440 (1992).
Shirley, L. G., "Applications of Tunable Lasers to Laser Radar and 3D Imaging," Technical Report 1025, Massachusetts Institute of Technology, Lincoln Laboratory, (1995).
K. Creath, "Phase-measurement interferometry techniques," Chap. 5 in Progress in Optics XXVI, E. Wolf Ed. pp. 349-393, Elsevier Science Publishers, New York, NY (1988).
G.T. Reid, R.C. Rixon, and H.I. Messer, "Absolute and comparative measurements of three-dimensional shape by phase measuring moire topography," Optics and Laser Technology, 315-319, Dec., (1984).
G. Indebetouw, "Profile measurement using projection of running fringes," Applied Optics, 17(18), 2930-2933 (1978).
V. Srinivasan, H.C. Liu, and M. Halioua, "Automated phase-measuring profilometry of 3-D diffuse objects," Applied Optics, 23(18), 3105-3108 (1984).
L.S. Wang, B.N. Dobbins, K. Jambunathan, and X.P. Wu, "Fibre optic shape measuring system using phase stepping speckle pattern interferometry," SPIE, 2088, MJ. Downs Ed., pp. 104-110 (1993).
L.H. Bieman, "Absolute measurement using field shifted moire," SPIE, 1614, 259-264 (1991).
H.O. Saldner and J.M. Huntley, "Temporal phase unwrapping: application to surface profiling of discontinuous objects," Applied Optics, 36(13), 2770-2775 (1997).
K. Creath, "Phase-shifting speckle interferomety," Applied Optics, vol. 24, No. 18, (1985).
J.M Huntley and H.O. Saldner, "Shape measurement by temporal phase unwrapping and spatial light modulator-based fringe projector," SPIE, vol. 3100, 185-192, (1997).
R.W. Wygant, S.P. Almeida, O.D.D. Soares, "Surface inspection via projection interferometry," Applied Optics, vol. 27, No. 22, (1988).
D. Paoletti and S. Spagnolo, "Fast Fourier Transformed Electronic Speckle Contouring for Diffuse Surfaces Profilometry," Optics and Lasers in Engineering, 20, 87-96, (1994).
G. Sansoni, L. Biancardi, U. Minoni, F. Docchio, "A Novel, Adaptive System for 3-D Optical Profilometry Using a Liquid Crystal Light Projector," IEEE Transactions on Instrumentation and Measurement, vol. 43, No. 4, (1994).
M. Chang, C. Ho, C. Hu, "A Design for an Optical Coordinate Measuring Machine System," Proc. Natl. Sci. Counc. ROC(A), vol. 18, No. 5, 477-484, (1994).
C. Joenathan, B. Pfister, H.J. Tiziani, "Contouring by electronic speckle pattern interferometry employing dual beam illumination," Applied Optics, vol. 29, No. 13, (1990).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Apparatus and methods for contour measurement using movable sour does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Apparatus and methods for contour measurement using movable sour, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and methods for contour measurement using movable sour will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-687988

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.